Phone: (951) 827-5448
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Research Facilities

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Focused Ion Beam (FIB) with Helium, Gallium,Neon

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Physical Property Measurement System with range of 9T and 1.8k

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Low noise measurement Facility with range of 4k and nano-Amps

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Clean Room facility with consist of photo-lithography, optical microscopy, Glove box

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AJA sputtering system

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Argon ion mills

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Automatic Dicing Saw

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Reactive sputtering system

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KLA Tencor sample Thickness measurement unit

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Wire bounding system