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Research
We began with a series of training seminars by Dr. Wang's graduate students that gave a general introduction to IC design, simulation, and testing.



We will be focusing on ESD protection for ICs. For more information, see the book by Dr. Wang:
On-Chip ESD Protection for Integrated Circuits
Previous Years Research
2008
US-China IRES Program: Design, fabrication
and characterization of semiconductor devices
for RF and mixed-signal integrated circuits.
Ramirez, Israel; Ballou, Mike; Ukwu, Margaret;
Lu, Robert. University of California Riverside
Abstract: In an increasingly fast-changing technological
world, engineers and researchers need to learn how
to collaborate with people from different
backgrounds. Sponsored by the National Science
Foundation (NSF) under the International Research
Experience for Students (IRES) Program, 4
students had the opportunity to spend 3 weeks in
Beijing at the Institute of Microelectronics,
Tsinghua University (IMETU.) During this time,
we had the opportunity to conjointly work with
students from IMETU on design, fabrication and
measurement of semiconductor devices. There are
a lot of parameters to take into account in transistor
design such as the length and width of BJT to
control emitter-base and base-collector operation.
We learned design and optimize transistor
specifications by CAD, including saturation, cutoff
point, and breakdown threshold, etc. Once
fabricated, testing is a crucial part before a
transistor is mass-produced. The testing either
confirms your simulation or provides insights to
modify it. Knowledge of design, fabrication and
characterization of transistors is essential to design
RF and mixed-signal integrated circuits that we
will learn in future. During this time, we also
learned about various technical challenges in
modern IC technologies. Moreover, we learned to
effectively work in a team with foreign colleagues
and share ideas at cultural and academic levels,
which shall benefit us in our future career.
IRES2008Report.pdf (6.39 MB)
SCCUCR_poster.pdf (548 KB)
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